Conductivity evaluation of plated contact component surfaces 【DL available/AFM】
AFM can capture and measure extremely small surface topographies (roughness).
The AFM scanning probe microscope is a device that "detects various physical interactions between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties." These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be taken in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of conductivity or insulation. Using this analytical device, we conducted an investigation into the "surface treatment of plated connector contact parts." Please take a moment to read the PDF materials. Furthermore, in addition to this analytical device, our company also conducts various surface analyses such as XPS, AES, and GD-OES. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *We have many other achievements as well. If you request through the inquiry button, we will send them to you.
- Company：セイコーフューチャークリエーション
- Price：Other
